Patrick Hole, Malver n, has lately given two talks that discussed this technical note:

1) Using Nanoparticle Tracking Analysis (NTA) for Accurate and Complete Nanosuspension Characterisation, Clinam, Basel, Switzerland, 28 June – 1 July 2015 (

2) Improving repeatability and reproducibility of size and concentration measurements using nanoparticle tracking analysis, QualityNano Conference and Training Workshop, Heraklion, Greece, 15 – 17 July 2015 (

View the Technical Note >>